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Journal: Electronics, 2025
Volume: 14
Number: 3070
3070
Article: SDA-YOLO: Multi-Scale Dynamic Branching and Attention Fusion for Self-Explosion Defect Detection in Insulators
Authors: by Zhonghao Yang, Wangping Xu, Nanxing Chen, Yifu Chen, Kaijun Wu, Min Xie, Hong Xu and Enhui Zheng
Link: https://www.mdpi.com/2079-9292/14/15/3070

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