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Journal: Electronics, 2025
Volume: 14
Number: 2563
Article:
Total Ionizing Dose Effects on Lifetime of NMOSFETs Due to Hot Carrier-Induced Stress
Authors:
by
Yujuan He, Rui Gao, Teng Ma, Xiaowen Zhang, Xianyu Zhang and Yintang Yang
Link:
https://www.mdpi.com/2079-9292/14/13/2563
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