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Journal: Electronics, 2025
Volume: 14
Number: 2563

Article: Total Ionizing Dose Effects on Lifetime of NMOSFETs Due to Hot Carrier-Induced Stress
Authors: by Yujuan He, Rui Gao, Teng Ma, Xiaowen Zhang, Xianyu Zhang and Yintang Yang
Link: https://www.mdpi.com/2079-9292/14/13/2563

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