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Electronics2024, 13(8), 1512;https://doi.org/10.3390/electronics13081512

Journal: ElectronicsVolume: 13Number: 1512

Article: Neural Network-Based Approach for Failure and Life Prediction of Electronic Components under Accelerated Life Stress

Authors:
Yunfeng Qiu^1,2 and
Zehong Li^1,3,4,5,*

Link: https://www.mdpi.com/2079-9292/13/8/1512

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