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Journal: ElectronicsVolume: 13Number: 1360
Article: Development of a Wafer Defect Pattern Classifier Using Polar Coordinate System Transformed Inputs and Convolutional Neural Networks
  • Authors:
  • Moo Hyun Kim and
  • Tae Seon Kim*
Link: https://www.mdpi.com/2079-9292/13/7/1360

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