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Journal: Electronics, 2024
Volume: 13
Number: 1360
Article:
Development of a Wafer Defect Pattern Classifier Using Polar Coordinate System Transformed Inputs and Convolutional Neural Networks
Authors:
by
Moo Hyun Kim and Tae Seon Kim
Link:
https://www.mdpi.com/2079-9292/13/7/1360
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