Yu, R.;                     Li, Z.;                     Deng, X.;                     Wang, Z.;                     Zhang, H.;                     Liu, Z.    
        Margin Elimination in a 55 nm Near-Threshold Microcontroller with Adaptive Prediction Capability and Voltage Scaling. Electronics 2024, 13, 1211.
    https://doi.org/10.3390/electronics13071211
    AMA Style
    
                                Yu R,                                 Li Z,                                 Deng X,                                 Wang Z,                                 Zhang H,                                 Liu Z.        
                Margin Elimination in a 55 nm Near-Threshold Microcontroller with Adaptive Prediction Capability and Voltage Scaling. Electronics. 2024; 13(7):1211.
        https://doi.org/10.3390/electronics13071211
    
    Chicago/Turabian Style
    
                                Yu, Runze,                                 Zhenhao Li,                                 Xi Deng,                                 Zhaoxu Wang,                                 Haoming Zhang,                                 and Zhenglin Liu.        
                2024. "Margin Elimination in a 55 nm Near-Threshold Microcontroller with Adaptive Prediction Capability and Voltage Scaling" Electronics 13, no. 7: 1211.
        https://doi.org/10.3390/electronics13071211
    
    APA Style
    
                                Yu, R.,                                 Li, Z.,                                 Deng, X.,                                 Wang, Z.,                                 Zhang, H.,                                 & Liu, Z.        
        
        (2024). Margin Elimination in a 55 nm Near-Threshold Microcontroller with Adaptive Prediction Capability and Voltage Scaling. Electronics, 13(7), 1211.
        https://doi.org/10.3390/electronics13071211