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Journal: Electronics, 2024
Volume: 13
Number: 1020
Article:
Optimizing Confined Nitride Trap Layers for Improved Z-Interference in 3D NAND Flash Memory
Authors:
by
Yeeun Kim, Seul Ki Hong and Jong Kyung Park
Link:
https://www.mdpi.com/2079-9292/13/6/1020
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