Order Article Reprints

Zhang J, Xu C, Ma F, Xiang Z, Wang Y, Niu B, Wu Q, Wang Y. SF6 Dynamic Capacitance Measurement Methods for Breaks in the Breaking Process of Circuit Breakers. Electronics. 2024; 13(24):4881. https://doi.org/10.3390/electronics13244881

Zhang, Jianguo, Chuxiong Xu, Feiyue Ma, Zhonghua Xiang, Yaoping Wang, Bo Niu, Qiang Wu, and Yu Wang. 2024. "SF6 Dynamic Capacitance Measurement Methods for Breaks in the Breaking Process of Circuit Breakers" Electronics 13, no. 24: 4881. https://doi.org/10.3390/electronics13244881

Zhang, J., Xu, C., Ma, F., Xiang, Z., Wang, Y., Niu, B., Wu, Q., & Wang, Y. (2024). SF6 Dynamic Capacitance Measurement Methods for Breaks in the Breaking Process of Circuit Breakers. Electronics, 13(24), 4881. https://doi.org/10.3390/electronics13244881