Next Article in Journal
Indoor Positioning Method by CNN-LSTM of Continuous Received Signal Strength Indicator
Previous Article in Journal
Gate Oxide Reliability in Silicon Carbide Planar and Trench Metal-Oxide-Semiconductor Field-Effect Transistors Under Positive and Negative Electric Field Stress
 
 
Article

Article Versions Notes

Electronics 2024, 13(22), 4517; https://doi.org/10.3390/electronics13224517
Action Date Notes Link
article xml file uploaded 18 November 2024 08:27 CET Original file -
article xml uploaded. 18 November 2024 08:27 CET Update https://www.mdpi.com/2079-9292/13/22/4517/xml
article pdf uploaded. 18 November 2024 08:27 CET Version of Record https://www.mdpi.com/2079-9292/13/22/4517/pdf
article html file updated 18 November 2024 08:29 CET Original file https://www.mdpi.com/2079-9292/13/22/4517/html
Back to TopTop