Marques, C.M.; Wrobel, F.; Aguiar, Y.Q.; Michez, A.; Saigné, F.; Boch, J.; Dilillo, L.; GarcÃa AlÃa, R.
Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells. Electronics 2024, 13, 1954.
https://doi.org/10.3390/electronics13101954
AMA Style
Marques CM, Wrobel F, Aguiar YQ, Michez A, Saigné F, Boch J, Dilillo L, GarcÃa AlÃa R.
Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells. Electronics. 2024; 13(10):1954.
https://doi.org/10.3390/electronics13101954
Chicago/Turabian Style
Marques, Cleiton M., Frédéric Wrobel, Ygor Q. Aguiar, Alain Michez, Frédéric Saigné, Jérôme Boch, Luigi Dilillo, and Rubén GarcÃa AlÃa.
2024. "Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells" Electronics 13, no. 10: 1954.
https://doi.org/10.3390/electronics13101954
APA Style
Marques, C. M., Wrobel, F., Aguiar, Y. Q., Michez, A., Saigné, F., Boch, J., Dilillo, L., & GarcÃa AlÃa, R.
(2024). Evaluation of a Simplified Modeling Approach for SEE Cross-Section Prediction: A Case Study of SEU on 6T SRAM Cells. Electronics, 13(10), 1954.
https://doi.org/10.3390/electronics13101954
