Chen, Y.; Tang, Y.; Hao, H.; Zhou, J.; Yuan, H.; Zhang, Y.; Zhao, Y.
AMFF-YOLOX: Towards an Attention Mechanism and Multiple Feature Fusion Based on YOLOX for Industrial Defect Detection. Electronics 2023, 12, 1662.
https://doi.org/10.3390/electronics12071662
AMA Style
Chen Y, Tang Y, Hao H, Zhou J, Yuan H, Zhang Y, Zhao Y.
AMFF-YOLOX: Towards an Attention Mechanism and Multiple Feature Fusion Based on YOLOX for Industrial Defect Detection. Electronics. 2023; 12(7):1662.
https://doi.org/10.3390/electronics12071662
Chicago/Turabian Style
Chen, Yu, Yongwei Tang, Huijuan Hao, Jun Zhou, Huimiao Yuan, Yu Zhang, and Yuanyuan Zhao.
2023. "AMFF-YOLOX: Towards an Attention Mechanism and Multiple Feature Fusion Based on YOLOX for Industrial Defect Detection" Electronics 12, no. 7: 1662.
https://doi.org/10.3390/electronics12071662
APA Style
Chen, Y., Tang, Y., Hao, H., Zhou, J., Yuan, H., Zhang, Y., & Zhao, Y.
(2023). AMFF-YOLOX: Towards an Attention Mechanism and Multiple Feature Fusion Based on YOLOX for Industrial Defect Detection. Electronics, 12(7), 1662.
https://doi.org/10.3390/electronics12071662