Zhang, J.; Hu, X.; Zhang, T.; Liu, S.; Hu, K.; He, T.; Yang, X.; Ye, J.; Wang, H.; Tan, Y.;
et al. Binary Neighborhood Coordinate Descriptor for Circuit Board Defect Detection. Electronics 2023, 12, 1435.
https://doi.org/10.3390/electronics12061435
AMA Style
Zhang J, Hu X, Zhang T, Liu S, Hu K, He T, Yang X, Ye J, Wang H, Tan Y,
et al. Binary Neighborhood Coordinate Descriptor for Circuit Board Defect Detection. Electronics. 2023; 12(6):1435.
https://doi.org/10.3390/electronics12061435
Chicago/Turabian Style
Zhang, Jiaming, Xuejuan Hu, Tan Zhang, Shiqian Liu, Kai Hu, Ting He, Xiaokun Yang, Jianze Ye, Hengliang Wang, Yadan Tan,
and et al. 2023. "Binary Neighborhood Coordinate Descriptor for Circuit Board Defect Detection" Electronics 12, no. 6: 1435.
https://doi.org/10.3390/electronics12061435
APA Style
Zhang, J., Hu, X., Zhang, T., Liu, S., Hu, K., He, T., Yang, X., Ye, J., Wang, H., Tan, Y., & Liang, Y.
(2023). Binary Neighborhood Coordinate Descriptor for Circuit Board Defect Detection. Electronics, 12(6), 1435.
https://doi.org/10.3390/electronics12061435