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Journal: Electronics, 2023
Volume: 12
Number: 1026
Article:
Reliability Analysis of Failure-Dependent System Based on Bayesian Network and Fuzzy Inference Model
Authors:
by
Shangjia Xiang, Yaqiong Lv, Yifan Li and Lu Qian
Link:
https://www.mdpi.com/2079-9292/12/4/1026
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