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Electronics2023, 12(3), 474;https://doi.org/10.3390/electronics12030474

Journal: ElectronicsVolume: 12Number: 474

Article: Improvement Breakdown Voltage by a Using Crown-Shaped Gate

Authors:
Dong Gyu Park¹,
Hyunwoo Kim^2,*,† and
Jang Hyun Kim^1,*,†

Link: https://www.mdpi.com/2079-9292/12/3/474

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