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Journal: ElectronicsVolume: 12Number: 4849
Article: Influence of JFET Width on Short-Circuit Robustness of 1200 V SiC Power MOSFETs
- Authors:
- Hongyi Xu1,2,†,
- Baozhu Wang1,2,† and
- Na Ren2,3,*
- et al.
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