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Journal: Electronics, 2023
Volume: 12
Number: 4849
Article:
Influence of JFET Width on Short-Circuit Robustness of 1200 V SiC Power MOSFETs
Authors:
by
Hongyi Xu, Baozhu Wang, Na Ren, Hu Long, Kai Huang and Kuang Sheng
Link:
https://www.mdpi.com/2079-9292/12/23/4849
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