Shi, J.; Guo, X.; Wang, D.; Chen, B.; Zhao, Y.; Zhang, A.
A Measurement Method for the Charging Potential of Conductors in the Vicinity of HVDC Overhead Lines Based on a Non-Contact Electrometer. Electronics 2023, 12, 4567.
https://doi.org/10.3390/electronics12224567
AMA Style
Shi J, Guo X, Wang D, Chen B, Zhao Y, Zhang A.
A Measurement Method for the Charging Potential of Conductors in the Vicinity of HVDC Overhead Lines Based on a Non-Contact Electrometer. Electronics. 2023; 12(22):4567.
https://doi.org/10.3390/electronics12224567
Chicago/Turabian Style
Shi, Jinpeng, Xingxin Guo, Donglai Wang, Bo Chen, Yan Zhao, and Aijun Zhang.
2023. "A Measurement Method for the Charging Potential of Conductors in the Vicinity of HVDC Overhead Lines Based on a Non-Contact Electrometer" Electronics 12, no. 22: 4567.
https://doi.org/10.3390/electronics12224567
APA Style
Shi, J., Guo, X., Wang, D., Chen, B., Zhao, Y., & Zhang, A.
(2023). A Measurement Method for the Charging Potential of Conductors in the Vicinity of HVDC Overhead Lines Based on a Non-Contact Electrometer. Electronics, 12(22), 4567.
https://doi.org/10.3390/electronics12224567