Bai, J.; Zhang, X.; Qi, L.; Liu, W.; Zhou, X.; Liu, Y.; Lv, X.; Sun, B.; Duan, B.; Zhang, S.;
et al. Survey on Application of Trusted Computing in Industrial Control Systems. Electronics 2023, 12, 4182.
https://doi.org/10.3390/electronics12194182
AMA Style
Bai J, Zhang X, Qi L, Liu W, Zhou X, Liu Y, Lv X, Sun B, Duan B, Zhang S,
et al. Survey on Application of Trusted Computing in Industrial Control Systems. Electronics. 2023; 12(19):4182.
https://doi.org/10.3390/electronics12194182
Chicago/Turabian Style
Bai, Jing, Xiao Zhang, Longyun Qi, Wei Liu, Xianfei Zhou, Yin Liu, Xiaoliang Lv, Boyan Sun, Binbin Duan, Siyuan Zhang,
and et al. 2023. "Survey on Application of Trusted Computing in Industrial Control Systems" Electronics 12, no. 19: 4182.
https://doi.org/10.3390/electronics12194182
APA Style
Bai, J., Zhang, X., Qi, L., Liu, W., Zhou, X., Liu, Y., Lv, X., Sun, B., Duan, B., Zhang, S., & Che, X.
(2023). Survey on Application of Trusted Computing in Industrial Control Systems. Electronics, 12(19), 4182.
https://doi.org/10.3390/electronics12194182