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Journal: Electronics, 2023
Volume: 12
Number: 3060
Article:
YOLO-Xray: A Bubble Defect Detection Algorithm for Chip X-ray Images Based on Improved YOLOv5
Authors:
by
Jie Wang, Bin Lin, Gaomin Li, Yuezheng Zhou, Lijun Zhong, Xuan Li and Xiaohu Zhang
Link:
https://www.mdpi.com/2079-9292/12/14/3060
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