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Journal: Electronics, 2023
Volume: 12
Number: 2939

Article: A Thorough Evaluation of GaN HEMT Degradation under Realistic Power Amplifier Operation
Authors: by Gianni Bosi, Antonio Raffo, Valeria Vadalà, Rocco Giofrè, Giovanni Crupi and Giorgio Vannini
Link: https://www.mdpi.com/2079-9292/12/13/2939

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