Bosi, G.; Raffo, A.; Vadalà , V.; Giofrè, R.; Crupi, G.; Vannini, G.
A Thorough Evaluation of GaN HEMT Degradation under Realistic Power Amplifier Operation. Electronics 2023, 12, 2939.
https://doi.org/10.3390/electronics12132939
AMA Style
Bosi G, Raffo A, Vadalà V, Giofrè R, Crupi G, Vannini G.
A Thorough Evaluation of GaN HEMT Degradation under Realistic Power Amplifier Operation. Electronics. 2023; 12(13):2939.
https://doi.org/10.3390/electronics12132939
Chicago/Turabian Style
Bosi, Gianni, Antonio Raffo, Valeria Vadalà , Rocco Giofrè, Giovanni Crupi, and Giorgio Vannini.
2023. "A Thorough Evaluation of GaN HEMT Degradation under Realistic Power Amplifier Operation" Electronics 12, no. 13: 2939.
https://doi.org/10.3390/electronics12132939
APA Style
Bosi, G., Raffo, A., Vadalà , V., Giofrè, R., Crupi, G., & Vannini, G.
(2023). A Thorough Evaluation of GaN HEMT Degradation under Realistic Power Amplifier Operation. Electronics, 12(13), 2939.
https://doi.org/10.3390/electronics12132939