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Electronics2023, 12(13), 2833;https://doi.org/10.3390/electronics12132833

Journal: ElectronicsVolume: 12Number: 2833

Article: Heavy Ion Single Event Effects in CMOS Image Sensors: SET and SEU

Authors:
Zhikang Yang^1,2,
Lin Wen^1,* and
Yudong Li^1,*
et al.

Link: https://www.mdpi.com/2079-9292/12/13/2833

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