Order Article Reprints

Yang Z, Wen L, Li Y, Feng J, Zhou D, Liu B, Zhao Z, Guo Q. Heavy Ion Single Event Effects in CMOS Image Sensors: SET and SEU. Electronics. 2023; 12(13):2833. https://doi.org/10.3390/electronics12132833

Yang, Zhikang, Lin Wen, Yudong Li, Jie Feng, Dong Zhou, Bingkai Liu, Zitao Zhao, and Qi Guo. 2023. "Heavy Ion Single Event Effects in CMOS Image Sensors: SET and SEU" Electronics 12, no. 13: 2833. https://doi.org/10.3390/electronics12132833

Yang, Z., Wen, L., Li, Y., Feng, J., Zhou, D., Liu, B., Zhao, Z., & Guo, Q. (2023). Heavy Ion Single Event Effects in CMOS Image Sensors: SET and SEU. Electronics, 12(13), 2833. https://doi.org/10.3390/electronics12132833