Order Article Reprints

Zhao P, Li B, Liu H, Yang J, Jiao Y, Chen Q, Sun Y, Liu J. The Effects of Total Ionizing Dose on the SEU Cross-Section of SOI SRAMs. Electronics. 2022; 11(19):3188. https://doi.org/10.3390/electronics11193188

Zhao, Peixiong, Bo Li, Hainan Liu, Jinhu Yang, Yang Jiao, Qiyu Chen, Youmei Sun, and Jie Liu. 2022. "The Effects of Total Ionizing Dose on the SEU Cross-Section of SOI SRAMs" Electronics 11, no. 19: 3188. https://doi.org/10.3390/electronics11193188

Zhao, P., Li, B., Liu, H., Yang, J., Jiao, Y., Chen, Q., Sun, Y., & Liu, J. (2022). The Effects of Total Ionizing Dose on the SEU Cross-Section of SOI SRAMs. Electronics, 11(19), 3188. https://doi.org/10.3390/electronics11193188