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Journal: Electronics, 2022
Volume: 11
Number: 3188

Article: The Effects of Total Ionizing Dose on the SEU Cross-Section of SOI SRAMs
Authors: by Peixiong Zhao, Bo Li, Hainan Liu, Jinhu Yang, Yang Jiao, Qiyu Chen, Youmei Sun and Jie Liu
Link: https://www.mdpi.com/2079-9292/11/19/3188

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