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Journal: Electronics, 2022
Volume: 11
Number: 2043

Article: TAISAM: A Transistor Array-Based Test Method for Characterizing Heavy Ion-Induced Sensitive Areas in Semiconductor Materials
Authors: by Jinjin Shao, Ruiqiang Song, Yaqing Chi, Bin Liang and Zhenyu Wu
Link: https://www.mdpi.com/2079-9292/11/13/2043

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