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Naftaly M, Das S, Gallop J, Pan K, Alkhalil F, Kariyapperuma D, Constant S, Ramsdale C, Hao L. Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques. Electronics. 2021; 10(8):960. https://doi.org/10.3390/electronics10080960

Naftaly, Mira, Satyajit Das, John Gallop, Kewen Pan, Feras Alkhalil, Darshana Kariyapperuma, Sophie Constant, Catherine Ramsdale, and Ling Hao. 2021. "Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques" Electronics 10, no. 8: 960. https://doi.org/10.3390/electronics10080960

Naftaly, M., Das, S., Gallop, J., Pan, K., Alkhalil, F., Kariyapperuma, D., Constant, S., Ramsdale, C., & Hao, L. (2021). Sheet Resistance Measurements of Conductive Thin Films: A Comparison of Techniques. Electronics, 10(8), 960. https://doi.org/10.3390/electronics10080960