Zhang, Q.; Wang, S.; Dong, X.; Liu, M.; Ou, Q.; Lv, F.
Research of ZnO Arrester Deterioration Mechanism Based on Electrical Performance and Micro Material Test. Electronics 2021, 10, 2624.
https://doi.org/10.3390/electronics10212624
AMA Style
Zhang Q, Wang S, Dong X, Liu M, Ou Q, Lv F.
Research of ZnO Arrester Deterioration Mechanism Based on Electrical Performance and Micro Material Test. Electronics. 2021; 10(21):2624.
https://doi.org/10.3390/electronics10212624
Chicago/Turabian Style
Zhang, Qizhe, Shenghui Wang, Xinghao Dong, Mingliang Liu, Qi Ou, and Fangcheng Lv.
2021. "Research of ZnO Arrester Deterioration Mechanism Based on Electrical Performance and Micro Material Test" Electronics 10, no. 21: 2624.
https://doi.org/10.3390/electronics10212624
APA Style
Zhang, Q., Wang, S., Dong, X., Liu, M., Ou, Q., & Lv, F.
(2021). Research of ZnO Arrester Deterioration Mechanism Based on Electrical Performance and Micro Material Test. Electronics, 10(21), 2624.
https://doi.org/10.3390/electronics10212624