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Journal: Electronics, 2021
Volume: 10
Number: 1835
Article:
Selective Code Duplication for Soft Error Protection on VLIW Architectures
Authors:
by
Yohan Ko, Soohwan Kim, Hyunchoong Kim and Kyoungwoo Lee
Link:
https://www.mdpi.com/2079-9292/10/15/1835
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