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Journal: Electronics, 2021
Volume: 10
Number: 1748
Article:
Novel MOA Fault Detection Technology Based on Small Sample Infrared Image
Authors:
by
Baoquan Wei, Yong Zuo, Yande Liu, Wei Luo, Kaiyun Wen and Fangming Deng
Link:
https://www.mdpi.com/2079-9292/10/15/1748
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