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Journal: J. Low Power Electron. Appl., 2019
Volume: 9
Number: 18
Article:
Aggressive Exclusion of Scan Flip-Flops from Compression Architecture for Better Coverage and Reduced TDV: A Hybrid Approach
Authors:
by
Pralhadrao V. Shantagiri and Rohit Kapur
Link:
https://www.mdpi.com/2079-9268/9/2/18
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