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Journal: J. Low Power Electron. Appl., 2019
Volume: 9
Number: 5

Article: Power and Area Efficient Clock Stretching and Critical Path Reshaping for Error Resilience
Authors: by Mini Jayakrishnan, Alan Chang and Tony Tae-Hyoung Kim
Link: https://www.mdpi.com/2079-9268/9/1/5

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