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Journal: Nanomaterials, 2023
Volume: 13
Number: 1259

Article: Insight into over Repair of Hot Carrier Degradation by GIDL Current in Si p-FinFETs Using Ultra-Fast Measurement Technique
Authors: by Hao Chang, Guilei Wang, Hong Yang, Qianqian Liu, Longda Zhou, Zhigang Ji, Ruixi Yu, Zhenhua Wu, Huaxiang Yin, Anyan Du, Junfeng Li, Jun Luo, Chao Zhao and Wenwu Wang
Link: https://www.mdpi.com/2079-4991/13/7/1259

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