Hakeem, A.S.;                     Ali, S.;                     Höche, T.;                     Drmosh, Q.A.;                     Khan, A.A.;                     Jonson, B.    
        Microstructure Evaluation and Impurities in La Containing Silicon Oxynitrides. Nanomaterials 2021, 11, 1896.
    https://doi.org/10.3390/nano11081896
    AMA Style
    
                                Hakeem AS,                                 Ali S,                                 Höche T,                                 Drmosh QA,                                 Khan AA,                                 Jonson B.        
                Microstructure Evaluation and Impurities in La Containing Silicon Oxynitrides. Nanomaterials. 2021; 11(8):1896.
        https://doi.org/10.3390/nano11081896
    
    Chicago/Turabian Style
    
                                Hakeem, Abbas Saeed,                                 Sharafat Ali,                                 Thomas Höche,                                 Qasem Ahmed Drmosh,                                 Amir Azam Khan,                                 and Bo Jonson.        
                2021. "Microstructure Evaluation and Impurities in La Containing Silicon Oxynitrides" Nanomaterials 11, no. 8: 1896.
        https://doi.org/10.3390/nano11081896
    
    APA Style
    
                                Hakeem, A. S.,                                 Ali, S.,                                 Höche, T.,                                 Drmosh, Q. A.,                                 Khan, A. A.,                                 & Jonson, B.        
        
        (2021). Microstructure Evaluation and Impurities in La Containing Silicon Oxynitrides. Nanomaterials, 11(8), 1896.
        https://doi.org/10.3390/nano11081896