Aboljadayel, R.O.M.; Ionescu, A.; Burton, O.J.; Cheglakov, G.; Hofmann, S.; Barnes, C.H.W.
Growth and Characterisation Studies of Eu3O4 Thin Films Grown on Si/SiO2 and Graphene. Nanomaterials 2021, 11, 1598.
https://doi.org/10.3390/nano11061598
AMA Style
Aboljadayel ROM, Ionescu A, Burton OJ, Cheglakov G, Hofmann S, Barnes CHW.
Growth and Characterisation Studies of Eu3O4 Thin Films Grown on Si/SiO2 and Graphene. Nanomaterials. 2021; 11(6):1598.
https://doi.org/10.3390/nano11061598
Chicago/Turabian Style
Aboljadayel, Razan O. M., Adrian Ionescu, Oliver J. Burton, Gleb Cheglakov, Stephan Hofmann, and Crispin H. W. Barnes.
2021. "Growth and Characterisation Studies of Eu3O4 Thin Films Grown on Si/SiO2 and Graphene" Nanomaterials 11, no. 6: 1598.
https://doi.org/10.3390/nano11061598
APA Style
Aboljadayel, R. O. M., Ionescu, A., Burton, O. J., Cheglakov, G., Hofmann, S., & Barnes, C. H. W.
(2021). Growth and Characterisation Studies of Eu3O4 Thin Films Grown on Si/SiO2 and Graphene. Nanomaterials, 11(6), 1598.
https://doi.org/10.3390/nano11061598