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Journal: NanomaterialsVolume: 10Number: 1247
Article: Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements and Modelling
  • Authors:
  • Rajkiran Tholapi1,*,
  • Manon Gallard1,2 and
  • Nelly Burle1
  • et al.
Link: https://www.mdpi.com/2079-4991/10/6/1247

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