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Journal: Nanomaterials, 2020
Volume: 10
Number: 1247
Article:
Stress Buildup Upon Crystallization of GeTe Thin Films: Curvature Measurements and Modelling
Authors:
by
Rajkiran Tholapi, Manon Gallard, Nelly Burle, Christophe Guichet, Stephanie Escoubas, Magali Putero, Cristian Mocuta, Marie-Ingrid Richard, Rebecca Chahine, Chiara Sabbione, Mathieu Bernard, Leila Fellouh, Pierre Noé and Olivier Thomas
Link:
https://www.mdpi.com/2079-4991/10/6/1247
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