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Journal: Membranes, 2021
Volume: 11
Number: 954
Article:
An Empirical Modeling of Gate Voltage-Dependent Behaviors of Amorphous Oxide Semiconductor Thin-Film Transistors including Consideration of Contact Resistance and Disorder Effects at Room Temperature
Authors:
by
Sungsik Lee
Link:
https://www.mdpi.com/2077-0375/11/12/954
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