Order Article Reprints

Chou Y-C, Kuo C-J, Chen T-T, Horng G-J, Pai M-Y, Wu M-E, Lin Y-C, Hung M-H, Su W-T, Chen Y-C, et al. Deep-Learning-Based Defective Bean Inspection with GAN-Structured Automated Labeled Data Augmentation in Coffee Industry. Applied Sciences. 2019; 9(19):4166. https://doi.org/10.3390/app9194166

Chou, Yung-Chien, Cheng-Ju Kuo, Tzu-Ting Chen, Gwo-Jiun Horng, Mao-Yuan Pai, Mu-En Wu, Yu-Chuan Lin, Min-Hsiung Hung, Wei-Tsung Su, Yi-Chung Chen, and et al. 2019. "Deep-Learning-Based Defective Bean Inspection with GAN-Structured Automated Labeled Data Augmentation in Coffee Industry" Applied Sciences 9, no. 19: 4166. https://doi.org/10.3390/app9194166

Chou, Y.-C., Kuo, C.-J., Chen, T.-T., Horng, G.-J., Pai, M.-Y., Wu, M.-E., Lin, Y.-C., Hung, M.-H., Su, W.-T., Chen, Y.-C., Wang, D.-C., & Chen, C.-C. (2019). Deep-Learning-Based Defective Bean Inspection with GAN-Structured Automated Labeled Data Augmentation in Coffee Industry. Applied Sciences, 9(19), 4166. https://doi.org/10.3390/app9194166