Seyler, T.; Fratz, M.; Beckmann, T.; Schiller, A.; Bertz, A.; Carl, D.
Extending the Depth of Field beyond Geometrical Imaging Limitations Using Phase Noise as a Focus Measure in Multiwavelength Digital Holography. Appl. Sci. 2018, 8, 1042.
https://doi.org/10.3390/app8071042
AMA Style
Seyler T, Fratz M, Beckmann T, Schiller A, Bertz A, Carl D.
Extending the Depth of Field beyond Geometrical Imaging Limitations Using Phase Noise as a Focus Measure in Multiwavelength Digital Holography. Applied Sciences. 2018; 8(7):1042.
https://doi.org/10.3390/app8071042
Chicago/Turabian Style
Seyler, Tobias, Markus Fratz, Tobias Beckmann, Annelie Schiller, Alexander Bertz, and Daniel Carl.
2018. "Extending the Depth of Field beyond Geometrical Imaging Limitations Using Phase Noise as a Focus Measure in Multiwavelength Digital Holography" Applied Sciences 8, no. 7: 1042.
https://doi.org/10.3390/app8071042
APA Style
Seyler, T., Fratz, M., Beckmann, T., Schiller, A., Bertz, A., & Carl, D.
(2018). Extending the Depth of Field beyond Geometrical Imaging Limitations Using Phase Noise as a Focus Measure in Multiwavelength Digital Holography. Applied Sciences, 8(7), 1042.
https://doi.org/10.3390/app8071042