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Journal: Appl. Sci., 2024
Volume: 14
Number: 429

Article: Enhanced YOLOv8 with BiFPN-SimAM for Precise Defect Detection in Miniature Capacitors
Authors: by Ning Li, Tianrun Ye, Zhihua Zhou, Chunming Gao and Ping Zhang
Link: https://www.mdpi.com/2076-3417/14/1/429

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