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Journal: Appl. Sci., 2023
Volume: 13
Number: 5424
Article:
Crystal-Based X-ray Interferometry and Its Application to Phase-Contrast X-ray Imaging, Zeff Imaging, and X-ray Thermography
Authors:
by
Akio Yoneyama, Daiko Takamatsu, Thet-Thet Lwin, Shigehito Yamada, Tetsuya Takakuwa, Kazuyuki Hyodo, Keiichi Hirano and Satoshi Takeya
Link:
https://www.mdpi.com/2076-3417/13/9/5424
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