Yoneyama, A.; Takamatsu, D.; Lwin, T.-T.; Yamada, S.; Takakuwa, T.; Hyodo, K.; Hirano, K.; Takeya, S.
Crystal-Based X-ray Interferometry and Its Application to Phase-Contrast X-ray Imaging, Zeff Imaging, and X-ray Thermography. Appl. Sci. 2023, 13, 5424.
https://doi.org/10.3390/app13095424
AMA Style
Yoneyama A, Takamatsu D, Lwin T-T, Yamada S, Takakuwa T, Hyodo K, Hirano K, Takeya S.
Crystal-Based X-ray Interferometry and Its Application to Phase-Contrast X-ray Imaging, Zeff Imaging, and X-ray Thermography. Applied Sciences. 2023; 13(9):5424.
https://doi.org/10.3390/app13095424
Chicago/Turabian Style
Yoneyama, Akio, Daiko Takamatsu, Thet-Thet Lwin, Shigehito Yamada, Tetsuya Takakuwa, Kazuyuki Hyodo, Keiichi Hirano, and Satoshi Takeya.
2023. "Crystal-Based X-ray Interferometry and Its Application to Phase-Contrast X-ray Imaging, Zeff Imaging, and X-ray Thermography" Applied Sciences 13, no. 9: 5424.
https://doi.org/10.3390/app13095424
APA Style
Yoneyama, A., Takamatsu, D., Lwin, T.-T., Yamada, S., Takakuwa, T., Hyodo, K., Hirano, K., & Takeya, S.
(2023). Crystal-Based X-ray Interferometry and Its Application to Phase-Contrast X-ray Imaging, Zeff Imaging, and X-ray Thermography. Applied Sciences, 13(9), 5424.
https://doi.org/10.3390/app13095424