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Journal: Applied SciencesVolume: 13Number: 3388
Article: Analysis of Channel Potential Recovery According to the Back Pattern in 3D NAND Flash Memory
  • Authors:
  • Gyunseok Ryu,
  • Hyunju Kim and
  • Jihwan Lee
  • et al.
Link: https://www.mdpi.com/2076-3417/13/6/3388

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