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Journal: Appl. Sci., 2023
Volume: 13
Number: 3388
Article:
Analysis of Channel Potential Recovery According to the Back Pattern in 3D NAND Flash Memory
Authors:
by
Gyunseok Ryu, Hyunju Kim, Jihwan Lee and Myounggon Kang
Link:
https://www.mdpi.com/2076-3417/13/6/3388
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