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Journal: Applied SciencesVolume: 13Number: 2660
Article: An Expandable Yield Prediction Framework Using Explainable Artificial Intelligence for Semiconductor Manufacturing
  • Authors:
  • Youjin Lee1,2,* and
  • Yonghan Roh1,3
Link: https://www.mdpi.com/2076-3417/13/4/2660

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