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Journal: Applied SciencesVolume: 12Number: 1245
Article: Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS) Profiling of Self Assembled Monolayer (SAM) Patterns Based on Vapor Deposition Technique
  • Authors:
  • Shi Li1,2,
  • Hongru Zhang3 and
  • Gaoshan Jing5,*
  • et al.
Link: https://www.mdpi.com/2076-3417/12/3/1245

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