Ku, Y.-S.; Chang, P.-Y.; Lee, H.-W.; Lo, C.-W.; Chen, Y.-C.; Cho, C.-H.
Metrology for Measuring Bumps in a Protection Layer Based on Phase Shifting Fringe Projection. Appl. Sci. 2022, 12, 898.
https://doi.org/10.3390/app12020898
AMA Style
Ku Y-S, Chang P-Y, Lee H-W, Lo C-W, Chen Y-C, Cho C-H.
Metrology for Measuring Bumps in a Protection Layer Based on Phase Shifting Fringe Projection. Applied Sciences. 2022; 12(2):898.
https://doi.org/10.3390/app12020898
Chicago/Turabian Style
Ku, Yi-Sha, Po-Yi Chang, Han-Wen Lee, Chun-Wei Lo, Yi-Chang Chen, and Chia-Hung Cho.
2022. "Metrology for Measuring Bumps in a Protection Layer Based on Phase Shifting Fringe Projection" Applied Sciences 12, no. 2: 898.
https://doi.org/10.3390/app12020898
APA Style
Ku, Y.-S., Chang, P.-Y., Lee, H.-W., Lo, C.-W., Chen, Y.-C., & Cho, C.-H.
(2022). Metrology for Measuring Bumps in a Protection Layer Based on Phase Shifting Fringe Projection. Applied Sciences, 12(2), 898.
https://doi.org/10.3390/app12020898