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Journal: Applied SciencesVolume: 11Number: 11107
Article: High Reliability Evaluation and Lifetime Prediction of 50 GHz Athermal AWG Module
  • Authors:
  • Kwang-Su Yun1,2,
  • Chong-Hee Yu1 and
  • Kwon-Seob Lim1
  • et al.
Link: https://www.mdpi.com/2076-3417/11/23/11107

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