López de la Rosa, F.; Sánchez-Reolid, R.; Gómez-Sirvent, J.L.; Morales, R.; Fernández-Caballero, A.
A Review on Machine and Deep Learning for Semiconductor Defect Classification in Scanning Electron Microscope Images. Appl. Sci. 2021, 11, 9508.
https://doi.org/10.3390/app11209508
AMA Style
López de la Rosa F, Sánchez-Reolid R, Gómez-Sirvent JL, Morales R, Fernández-Caballero A.
A Review on Machine and Deep Learning for Semiconductor Defect Classification in Scanning Electron Microscope Images. Applied Sciences. 2021; 11(20):9508.
https://doi.org/10.3390/app11209508
Chicago/Turabian Style
López de la Rosa, Francisco, Roberto Sánchez-Reolid, José L. Gómez-Sirvent, Rafael Morales, and Antonio Fernández-Caballero.
2021. "A Review on Machine and Deep Learning for Semiconductor Defect Classification in Scanning Electron Microscope Images" Applied Sciences 11, no. 20: 9508.
https://doi.org/10.3390/app11209508
APA Style
López de la Rosa, F., Sánchez-Reolid, R., Gómez-Sirvent, J. L., Morales, R., & Fernández-Caballero, A.
(2021). A Review on Machine and Deep Learning for Semiconductor Defect Classification in Scanning Electron Microscope Images. Applied Sciences, 11(20), 9508.
https://doi.org/10.3390/app11209508