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Journal: Applied SciencesVolume: 11Number: 7498
Article: Cu-Doped TiNxOy Thin Film Resistors DC/RF Performance and Reliability
  • Authors:
  • Lev V. Shanidze1,
  • Anton S. Tarasov1,2 and
  • Mikhail V. Rautskiy1
  • et al.
Link: https://www.mdpi.com/2076-3417/11/16/7498

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