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Journal: Diagnostics, 2022
Volume: 12
Number: 2103
Article:
Characterization of Flexible Amorphous Silicon Thin-Film Transistor-Based Detectors with Positive-Intrinsic-Negative Diode in Radiography
Authors:
by
Bongju Han, Minji Park, Kyuseok Kim and Youngjin Lee
Link:
https://www.mdpi.com/2075-4418/12/9/2103
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