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Journal: DiagnosticsVolume: 12Number: 2103
Article: Characterization of Flexible Amorphous Silicon Thin-Film Transistor-Based Detectors with Positive-Intrinsic-Negative Diode in Radiography
  • Authors:
  • Bongju Han1,†,
  • Minji Park2,3,† and
  • Kyuseok Kim4,*,‡
  • et al.
Link: https://www.mdpi.com/2075-4418/12/9/2103

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