Milián-Sánchez, V.; Iglesias-MartÃnez, M.E.; Carmenate, J.G.; Castro-Palacio, J.C.; Outeiriño, E.B.; Fernández de Córdoba, P.; Muñoz-Pérez, F.M.; Monsoriu, J.A.; Sahu, S.
Spectral Analysis of Anomalous Capacitance Measurements in Interleaving Structures: Study of Frequency Distribution in Photomultipliers. Symmetry 2024, 16, 15.
https://doi.org/10.3390/sym16010015
AMA Style
Milián-Sánchez V, Iglesias-MartÃnez ME, Carmenate JG, Castro-Palacio JC, Outeiriño EB, Fernández de Córdoba P, Muñoz-Pérez FM, Monsoriu JA, Sahu S.
Spectral Analysis of Anomalous Capacitance Measurements in Interleaving Structures: Study of Frequency Distribution in Photomultipliers. Symmetry. 2024; 16(1):15.
https://doi.org/10.3390/sym16010015
Chicago/Turabian Style
Milián-Sánchez, VÃctor, Miguel E. Iglesias-MartÃnez, Jose Guerra Carmenate, Juan Carlos Castro-Palacio, Eduardo Balvis Outeiriño, Pedro Fernández de Córdoba, Francisco Misael Muñoz-Pérez, Juan Antonio Monsoriu, and Sarira Sahu.
2024. "Spectral Analysis of Anomalous Capacitance Measurements in Interleaving Structures: Study of Frequency Distribution in Photomultipliers" Symmetry 16, no. 1: 15.
https://doi.org/10.3390/sym16010015
APA Style
Milián-Sánchez, V., Iglesias-MartÃnez, M. E., Carmenate, J. G., Castro-Palacio, J. C., Outeiriño, E. B., Fernández de Córdoba, P., Muñoz-Pérez, F. M., Monsoriu, J. A., & Sahu, S.
(2024). Spectral Analysis of Anomalous Capacitance Measurements in Interleaving Structures: Study of Frequency Distribution in Photomultipliers. Symmetry, 16(1), 15.
https://doi.org/10.3390/sym16010015