Liu, J.; Wang, D.; Liu, M.; Jin, M.; Sun, X.; Pang, Y.; Yan, Q.; Liu, C.; Liu, S.
QTL Mapping for Agronomic Important Traits in Well-Adapted Wheat Cultivars. Agronomy 2024, 14, 940.
https://doi.org/10.3390/agronomy14050940
AMA Style
Liu J, Wang D, Liu M, Jin M, Sun X, Pang Y, Yan Q, Liu C, Liu S.
QTL Mapping for Agronomic Important Traits in Well-Adapted Wheat Cultivars. Agronomy. 2024; 14(5):940.
https://doi.org/10.3390/agronomy14050940
Chicago/Turabian Style
Liu, Jingxian, Danfeng Wang, Mingyu Liu, Meijin Jin, Xuecheng Sun, Yunlong Pang, Qiang Yan, Cunzhen Liu, and Shubing Liu.
2024. "QTL Mapping for Agronomic Important Traits in Well-Adapted Wheat Cultivars" Agronomy 14, no. 5: 940.
https://doi.org/10.3390/agronomy14050940
APA Style
Liu, J., Wang, D., Liu, M., Jin, M., Sun, X., Pang, Y., Yan, Q., Liu, C., & Liu, S.
(2024). QTL Mapping for Agronomic Important Traits in Well-Adapted Wheat Cultivars. Agronomy, 14(5), 940.
https://doi.org/10.3390/agronomy14050940