Yang, J.-Y.; Jung, S.; Byeon, E.-Y.; Lee, H.H.; Kim, D.-G.; Kim, H.J.; Jang, H.W.; Lee, S.
Preliminary Validation of a Continuum Model for Dimple Patterns on Polyethylene Naphthalate via Ar Ion Beam Sputtering. Polymers 2021, 13, 1932.
https://doi.org/10.3390/polym13121932
AMA Style
Yang J-Y, Jung S, Byeon E-Y, Lee HH, Kim D-G, Kim HJ, Jang HW, Lee S.
Preliminary Validation of a Continuum Model for Dimple Patterns on Polyethylene Naphthalate via Ar Ion Beam Sputtering. Polymers. 2021; 13(12):1932.
https://doi.org/10.3390/polym13121932
Chicago/Turabian Style
Yang, Jun-Yeong, Sunghoon Jung, Eun-Yeon Byeon, Hyun Hwi Lee, Do-Geun Kim, Hyo Jung Kim, Ho Won Jang, and Seunghun Lee.
2021. "Preliminary Validation of a Continuum Model for Dimple Patterns on Polyethylene Naphthalate via Ar Ion Beam Sputtering" Polymers 13, no. 12: 1932.
https://doi.org/10.3390/polym13121932
APA Style
Yang, J.-Y., Jung, S., Byeon, E.-Y., Lee, H. H., Kim, D.-G., Kim, H. J., Jang, H. W., & Lee, S.
(2021). Preliminary Validation of a Continuum Model for Dimple Patterns on Polyethylene Naphthalate via Ar Ion Beam Sputtering. Polymers, 13(12), 1932.
https://doi.org/10.3390/polym13121932