Jang, H.-S.; Kim, J.H.; Janardhanam, V.; Jeong, H.-H.; Kim, S.-J.; Choi, C.-J.
Microstructural Evolution of Ni-Stanogermanides and Sn Segregation during Interfacial Reaction between Ni Film and Ge1−xSnx Epilayer Grown on Si Substrate. Crystals 2024, 14, 134.
https://doi.org/10.3390/cryst14020134
AMA Style
Jang H-S, Kim JH, Janardhanam V, Jeong H-H, Kim S-J, Choi C-J.
Microstructural Evolution of Ni-Stanogermanides and Sn Segregation during Interfacial Reaction between Ni Film and Ge1−xSnx Epilayer Grown on Si Substrate. Crystals. 2024; 14(2):134.
https://doi.org/10.3390/cryst14020134
Chicago/Turabian Style
Jang, Han-Soo, Jong Hee Kim, Vallivedu Janardhanam, Hyun-Ho Jeong, Seong-Jong Kim, and Chel-Jong Choi.
2024. "Microstructural Evolution of Ni-Stanogermanides and Sn Segregation during Interfacial Reaction between Ni Film and Ge1−xSnx Epilayer Grown on Si Substrate" Crystals 14, no. 2: 134.
https://doi.org/10.3390/cryst14020134
APA Style
Jang, H.-S., Kim, J. H., Janardhanam, V., Jeong, H.-H., Kim, S.-J., & Choi, C.-J.
(2024). Microstructural Evolution of Ni-Stanogermanides and Sn Segregation during Interfacial Reaction between Ni Film and Ge1−xSnx Epilayer Grown on Si Substrate. Crystals, 14(2), 134.
https://doi.org/10.3390/cryst14020134
